Precisely detecting atomic position of atomic intensity images.
We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.
['Wang|Zhijun|Z|', 'Guo|Yaolin|Y|', 'Tang|Sai|S|', 'Li|Junjie|J|', 'Wang|Jincheng|J|', 'Zhou|Yaohe|Y|']
Atomic position Atomic intensity image Strain mapping